Advances in Materials Characterization: 1st Edition (Hardback) book cover

Advances in Materials Characterization

1st Edition

Edited by Baldev Raj, G. Amarendra, M.H. Manghnani

CRC Press

204 pages

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Hardback: 9781420047295
pub: 2007-01-29
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Materials characterization is an important area of fundamental and technological interest. Over the years, a variety of experimental techniques have been developed for characterizing the physical and chemical properties of materials. Advances in Materials Characterization offers an overview of this continually emerging discipline by providing an in-depth exploration of the latest techniques. It brings together a highly authoritative collection of articles written by experts from across the world who have been active in pioneering the techniques. Each chapter provides an introduction and an overview of the technique, and then proceeds to demonstrate its application to selected problems.

Table of Contents


Introduction to Materials Characterization; Baldev Raj, G. Amarendra and M. H. Manghnani

Atomistic Characterization of Materials using Scanning Tunneling Microscopy (STM); Prof. S. Dharmadhikari, India

Recent Advances in Characterization of Materials using Electron Microscopy; Dr. M. Vijayalakshmi, India

X-ray Reflectance for Characterization of Multilayer Thin Films; Prof. Ajay Gupta, India

in national and international journals.

Latest Trends in Acoustic NDT Studies for Materials Characterization; Prof. C. H. Chen, USA, T. Jayakumar and Anish Kumar, India

Characterization of Soft Condensed Matter using Confocal Microscopy; Dr. B.V. R. Tata and Dr. Baldev Raj, India

Positron Annihilation Studies of Materials for Electronic Devices; Prof. R.. Suzuki, Japan and Dr.G . Amarendra, India

Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering; Prof. P.V. Zinn and Prof. M.H, Manghnani, USA

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