Applying the Rasch Model and Structural Equation Modeling to Higher Education : The Technology Satisfaction Model book cover
1st Edition

Applying the Rasch Model and Structural Equation Modeling to Higher Education
The Technology Satisfaction Model

  • Available for pre-order on May 26, 2023. Item will ship after June 16, 2023
ISBN 9781032471402
June 16, 2023 Forthcoming by Chapman & Hall
148 Pages 22 B/W Illustrations

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USD $120.00

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Book Description

This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and Structural Equation Modelling (SEM) – a multivariate technique - to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalization in HE research. This title presents theoretical and methodological insight of use to researchers in HE.

Table of Contents

Abstract, Introduction, Literature Review, Hypotheses of the TSM Model, Method, Findings, Discussion, Conclusion, Implications for policy and practice, References , 2. Abstract, Introduction, Background, Literature, Review. Hypotheses, Methodology, Results, Discussion, Conclusion, References 3. Abstract, Introduction, Review of the Literature, Research Framework, Research Hypotheses, Methodology, Results, Estimating the Structural Model, Discussion, Conclusion, References, 4. Abstract, Introduction, Background, Literature review, Methodology, Instrument, Instrument reliability and validity, Results, The revised technology satisfaction model, Cross-validation of technology satisfaction model, Discussion, Conclusion, References

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A.Y.M Atiquil Islam is Associate Professor in the Department of Education Information Technology at East China Normal University. He obtained a multidimensional PhD degree by combining two faculties, namely, Education and Computer Science & Information Technology from the University of Malaysia. His career has seen international collaboration on conducting quantitative research in higher education (including in USA, UK, Malaysia, China, Saudi Arabia, Oman, Philippine, Iraq, Algeria, Pakistan, and Bangladesh).