1st Edition

Data Converters, Phase-Locked Loops, and Their Applications




ISBN 9781138599734
Published October 11, 2018 by CRC Press
489 Pages

USD $130.00

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Book Description

With a focus on designing and verifying CMOS analog integrated circuits, the book reviews design techniques for mixed-signal building blocks, such as Nyquist and oversampling data converters, and circuits for signal generation, synthesis, and recovery. The text details all aspects, from specifications to the final circuit, of the design of digital-to-analog converters, analog-to-digital converters, phase-locked loops, delay-locked loops, high-speed input/output link transceivers, and class D amplifiers. Special emphasis is put on calibration methods that can be used to compensate circuit errors due to device mismatches and semiconductor process variations.

  • Gives an overview of data converters, phase- and delay-locked loop architectures,
    highlighting basic operation and design trade-offs.
  • Focus on circuit analysis methods useful to meet requirements for a high-speed and power-efficient operation.
  • Outlines design challenges of analog integrated circuits using state-of-the-art CMOS processes.
  • Presents design methodologies to optimize circuit performance on both transistor and architectural levels.
  • Includes open-ended circuit design case studies.

Table of Contents

1 Mixed-Signal Integrated Systems: Limitations and Challenges

1.1 Integrated circuit design flow

1.2 Design technique issues

1.3 Integrated system perspectives

1.4 Built-in self-test structures

1.5 Concluding remarks

1.6 To probe further

2 Data Converter Principles

2.1 Binary codes

2.2 Data converter characterization

2.3 Summary

Bibliography

3 Nyquist Digital-to-Analog Converters

3.1 Digital-to-analog converter (DAC)

3.2 Voltage-scaling DACs

3.3 Current-scaling DACs

3.4 Charge-scaling DAC

3.5 Hybrid DAC

3.6 Configuring a unipolar DAC for the bipolar conversion

3.7 Algorithmic DAC

3.8 Direct digital synthesizer

3.9 Summary

3.10 Circuit design assessment

Bibliography

4 Nyquist Analog-to-Digital Converters

4.1 Analog-to-digital converter (ADC) architectures

4.2 Summary

4.3 Circuit design assessment

Bibliography

5 Delta-Sigma Data Converters

5.1 Delta-sigma analog-to-digital converter

5.2 Delta-sigma digital-to-analog converter

5.3 Nyquist DAC design issues

5.4 Data converter testing and characterization

5.5 Delta-sigma modulator-based oscillator

5.6 Digital signal processor interfacing with data converters

5.7 Built-in self-test structures for data converters

5.8 Circuit design assessment

Bibliography

6 Circuits for Signal Generation and Synchronization

6.1 Generation of clock signals with nonoverlapping phases

6.2 Phase-locked loop

6.3 Charge-pump PLL building blocks

6.4 Applications

6.5 Delay-locked loop

6.6 PLL with a built-in self-test structure

6.7 PLL specifications

6.8 VCO-based analog-to-digital converter

6.9 PLL based on time-to-digital converter

6.10 High-speed input/output link transceiver

6.11 Relaxation oscillator

6.12 Class-D amplifier

6.13 Summary

6.14 Circuit design assessment

Bibliography

Appendix A Logic Building Blocks

A.1 Boolean algebra

A.2 Combinational logic circuits

A.3 Sequential logic circuits

A.4 Bibliography

Appendix B Notes on Circuit Analysis

B.1 Radius of curvature

B.2 Spectral analysis of PWM signals

B.3 Bibliography

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Author(s)

Biography

Tertulien Ndjountche holds a PhD degree in electrical engineering from Erlangen-Nuremberg University, Erlangen, Germany. He was with Siemens AG, Germany, where he was involved in the design and test of application specific integrated circuits for automotive and biomedical applications. He has worked as a professor and researcher at universities in Germany and Canada. He has published numerous technical papers and books in his fields of interest. He is a senior member of the Institute of Electrical and Electronics Engineers (IEEE) and a member of Professional Engineer Ontario (PEO), Canada.