Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003, 1st Edition (Hardback) book cover

Electron Microscopy and Analysis 2003

Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003, 1st Edition

Edited by S McVitie, D McComb

CRC Press

279 pages

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pub: 2004-02-19
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Description

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

Table of Contents

Plenary Lectures

Functional Materials and Biomaterials

New Instrumentation

Imaging Theory

Theory of Microscopy and Spectroscopy

Structural Materials

Advances in Nanoanalysis

Advances in Imaging

Sample Preparation and Nanofabrication

Surfaces and Interfaces

Nanomaterials

Author Index

Subject Index

About the Series

Institute of Physics Conference Series

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Subject Categories

BISAC Subject Codes/Headings:
SCI013060
SCIENCE / Chemistry / Industrial & Technical
SCI047000
SCIENCE / Microscopes & Microscopy
TEC019000
TECHNOLOGY & ENGINEERING / Lasers & Photonics