Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,, 2nd Edition (Hardback) book cover

Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,, 2nd Edition

Edited by Lawrence E Murr

CRC Press

856 pages

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Hardback: 9780824785567
pub: 1991-07-25
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Description

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Table of Contents

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.

About the Editor

Lawrence E. Murr

Subject Categories

BISAC Subject Codes/Headings:
TEC007000
TECHNOLOGY & ENGINEERING / Electrical
TEC019000
TECHNOLOGY & ENGINEERING / Lasers & Photonics