Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.
Table of Contents
Elements of problem-solving; how to use this book; spectroscopic and spectrometric techniques - x-ray photoelectron spectroscopy (ISS); compositional analysis by Auger electron and x-ray photoelectron spectroscopy; ion beam techniques - surface mass spectrometry; in-depth analysis - methods for depth profiling; ion beam effects in thin surface films and interfaces; surface modification by ion implantation; introduction to scanned probe microscopy; metallurgy; microelectronics and semiconductors; minerals, ceramics and glasses; composites; corrosion and surface analysis - an approach involving spectroscopic and electrochemical methods; problem-solving methods in tribology with surface specific techniques; catalyst characterization; adhesion science and technology; archaeomaterials; appendices - physical constants and conversion factors, data for the elements and isotopes, less commonly used techniques for analysis of surfaces and interfaces, core-level binding energies, Auger kinetic energies and modified Auger parameters for some chemical elements in various compounds, documentary standards in surface analysis - the way of the future?.