"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
"Industry accolades for the previous edition. . . . . .should be available to all workers in x-ray analysis, and they should do more than just scan the various chapters, but read them in detail….anyone who does that will learn something, regardless of how long they have been working in the field."
X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.