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2nd Edition

Introduction to Texture Analysis Macrotexture, Microtexture, and Orientation Mapping, Second Edition

By Olaf Engler, Valerie Randle Copyright 2010
    ISBN 9781420063653
    488 Pages 199 B/W Illustrations
    Published February 1, 1993 by CRC Press

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    ISBN 9781138410220
    Published July 27, 2017 by CRC Press

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    The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture.

    Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections:

    • Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis.

    • Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis.

    • Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity.

    Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

    Part I: Fundamental Issues



    The Classical Approach to Texture

    The Modern Approach to Texture: Microtexture

    A Guide to the Book


    Descriptors of Orientation

    Crystal Structures and Crystal Symmetries

    Transformation between Coordinate Systems: The Rotation Matrix

    The "Ideal Orientation" (Miller or Miller–Bravais Indices) Notation

    The Reference Sphere, Pole Figure, and Inverse Pole Figure

    The Euler Angles and Euler Space

    The Angle/Axis of Rotation and Cylindrical Angle/Axis Space

    The Rodrigues Vector and Rodrigues Space


    Application of Diffraction to Texture Analysis

    Diffraction of Radiation and Bragg’s Law

    Structure Factor

    Laue and Debye–Scherrer Methods

    Absorption and Depth of Penetration

    Characteristics of Radiations Used for Texture Analysis


    Part II: Macrotexture Analysis


    Macrotexture Measurements

    Principle of Pole Figure Measurement

    X-Ray Diffraction Methods

    Neutron Diffraction Methods

    Texture Measurements in Low-Symmetry and Multiphase Materials

    Sample Preparation


    Evaluation and Representation of Macrotexture Data

    Pole Figure and Inverse Pole Figure

    Determination of the Orientation Distribution Function from Pole Figure Data

    Representation and Display of Texture in Euler Space

    Examples of Typical Textures in Metals


    Part III: Microtexture Analysis


    The Kikuchi Diffraction Pattern

    The Kikuchi Diffraction Pattern

    Quantitative Evaluation of the Kikuchi Pattern

    Pattern Quality


    Scanning Electron Microscopy-Based Techniques

    Micro-Kossel Technique

    Electron Channeling Diffraction and Selected-Area Channeling

    Evolution of Electron Backscatter Diffraction

    EBSD Specimen Preparation

    Experimental Considerations for EBSD

    Calibration of an EBSD System

    Operation of an EBSD System and Primary Data Output


    Transmission Electron Microscopy–Based Techniques

    High-Resolution Electron Microscopy

    Selected Area Diffraction

    Kikuchi Patterns, Microdiffraction, and Convergent Beam Electron Diffraction


    Evaluation and Representation of Microtexture Data

    Representation of Orientations in a Pole Figure or Inverse Pole Figure

    Representation of Orientations in Euler Space

    Representation of Orientations in Rodrigues Space

    General Representation of Misorientation Data

    Representation of Misorientations in Three-Dimensional Spaces

    Normalization and Evaluation of the Misorientation Distribution Function

    Extraction of Quantified Data


    Orientation Microscopy and Orientation Mapping

    Historical Evolution

    Orientation Microscopy

    Orientation Mapping and Its Applications

    Orientation Microscopy in the TEM


    Crystallographic Analysis of Interfaces, Surfaces, and Connectivity

    Crystallographic Analysis of Grain Boundaries

    Crystallographic Analysis of Surfaces

    Orientation Connectivity and Spatial Distribution

    Orientation Relationships between Phases


    Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods

    Texture Analysis by Synchrotron Radiation

    Texture Analysis by Nondiffraction Techniques





    General Bibliography



    Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties.

    Valerie Randle has been eminent in the field of electron backscatter diffraction for more than 20 years. Her other main research interest is grain boundary engineering in metals and alloys. She has written more than 300 scientific publications on these research topics, including five textbooks. Randle is a past Welsh Woman of the Year and recipient of the Institute of Materials’ Rosenhain Medal. Currently, she is the senior professor in the Materials Research Centre at Swansea University in Wales, United Kingdom.

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