Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping, Second Edition, 2nd Edition (Paperback) book cover

Introduction to Texture Analysis

Macrotexture, Microtexture, and Orientation Mapping, Second Edition, 2nd Edition

By Olaf Engler, Valerie Randle

CRC Press

488 pages | 199 B/W Illus.

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Description

The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture.

Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections:

  • Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis.

  • Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis.

  • Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity.

Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Table of Contents

Part I: Fundamental Issues

Introduction

The Classical Approach to Texture

The Modern Approach to Texture: Microtexture

A Guide to the Book

Descriptors of Orientation

Crystal Structures and Crystal Symmetries

Transformation between Coordinate Systems: The Rotation Matrix

The "Ideal Orientation" (Miller or Miller–Bravais Indices) Notation

The Reference Sphere, Pole Figure, and Inverse Pole Figure

The Euler Angles and Euler Space

The Angle/Axis of Rotation and Cylindrical Angle/Axis Space

The Rodrigues Vector and Rodrigues Space

Application of Diffraction to Texture Analysis

Diffraction of Radiation and Bragg’s Law

Structure Factor

Laue and Debye–Scherrer Methods

Absorption and Depth of Penetration

Characteristics of Radiations Used for Texture Analysis

 

Part II: Macrotexture Analysis

Macrotexture Measurements

Principle of Pole Figure Measurement

X-Ray Diffraction Methods

Neutron Diffraction Methods

Texture Measurements in Low-Symmetry and Multiphase Materials

Sample Preparation

 

Evaluation and Representation of Macrotexture Data

Pole Figure and Inverse Pole Figure

Determination of the Orientation Distribution Function from Pole Figure Data

Representation and Display of Texture in Euler Space

Examples of Typical Textures in Metals

 

Part III: Microtexture Analysis

The Kikuchi Diffraction Pattern

The Kikuchi Diffraction Pattern

Quantitative Evaluation of the Kikuchi Pattern

Pattern Quality

Scanning Electron Microscopy-Based Techniques

Micro-Kossel Technique

Electron Channeling Diffraction and Selected-Area Channeling

Evolution of Electron Backscatter Diffraction

EBSD Specimen Preparation

Experimental Considerations for EBSD

Calibration of an EBSD System

Operation of an EBSD System and Primary Data Output

Transmission Electron Microscopy–Based Techniques

High-Resolution Electron Microscopy

Selected Area Diffraction

Kikuchi Patterns, Microdiffraction, and Convergent Beam Electron Diffraction

Evaluation and Representation of Microtexture Data

Representation of Orientations in a Pole Figure or Inverse Pole Figure

Representation of Orientations in Euler Space

Representation of Orientations in Rodrigues Space

General Representation of Misorientation Data

Representation of Misorientations in Three-Dimensional Spaces

Normalization and Evaluation of the Misorientation Distribution Function

Extraction of Quantified Data

Orientation Microscopy and Orientation Mapping

Historical Evolution

Orientation Microscopy

Orientation Mapping and Its Applications

Orientation Microscopy in the TEM

Crystallographic Analysis of Interfaces, Surfaces, and Connectivity

Crystallographic Analysis of Grain Boundaries

Crystallographic Analysis of Surfaces

Orientation Connectivity and Spatial Distribution

Orientation Relationships between Phases

Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods

Texture Analysis by Synchrotron Radiation

Texture Analysis by Nondiffraction Techniques

Appendices

Glossary

References

General Bibliography

Index

About the Authors

Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties.

Valerie Randle has been eminent in the field of electron backscatter diffraction for more than 20 years. Her other main research interest is grain boundary engineering in metals and alloys. She has written more than 300 scientific publications on these research topics, including five textbooks. Randle is a past Welsh Woman of the Year and recipient of the Institute of Materials’ Rosenhain Medal. Currently, she is the senior professor in the Materials Research Centre at Swansea University in Wales, United Kingdom.

Subject Categories

BISAC Subject Codes/Headings:
SCI077000
SCIENCE / Solid State Physics
SCI078000
SCIENCE / Spectroscopy & Spectrum Analysis
TEC009010
TECHNOLOGY & ENGINEERING / Chemical & Biochemical