Introductory Solid State Physics, Third Edition

The Materials and Methods of Solid State Physics. Crystallography. Diffraction. Defects in Crystals. Lattice Vibrations. Metallic Behavior and the Free Electron Gas. The Periodic Potential. The Cohesion of Pure Metals. Physical Properties of Metals. Semiconductors. Disordered and Amorphous Materials. Magnetism. Dielectric Media. Superconductivity. Surface Physics. The Nucleus and Solid State Physics.

Biography

Marcus C. Newton is a lecturer and head of the Coherent X-ray Science research group in the department of Physics & Astronomy at

the University of Southampton. He is interested in understanding phenomena in correlated electronic materials. His research is

focused on the use of coherent X-ray diffraction imaging (CXDI) to study nanoscale materials at hard X-ray synchrotron sources such

as the SACLA X-ray free electron laser (XFEL) facility and the Diamond Light Source. He is also at the forefront in the study of selfassembled

nanoscale materials and devices, including group II-VI semiconductor materials, and conducts theoretical research into nonlinear

optimisation and the phase retrieval problem. He is committed to research dissemination and currently delivers undergraduate

lecture courses on solid state physics and applied nuclear physics in the Physics & Astronomy department at the University of

Southampton, and supervises a number of undergraduate and postgraduate students. He received his PhD from University College

London (2007) and his BSci from Queen Mary College, University of London (2003).

Colin Inglefield is a professor in the Physics Department at Weber State University where he has taught a junior/senior level solid-state

course since 2000, and, more recently, a senior-level laboratory course in the characterization of materials. He also directs

undergraduate researchers in projects in condensed-matter physics. He received his PhD from the University of Utah in 1998 and his

BS from Rensselaer Polytechnics in 1992. His research interests include optical characterization of semiconductors, atomic force

microscopy, disorder in semiconductors, and semiconductor device physics