Particle and Particle Systems Characterization : Small-Angle Scattering (SAS) Applications book cover
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Particle and Particle Systems Characterization
Small-Angle Scattering (SAS) Applications





ISBN 9781466581777
Published November 22, 2013 by CRC Press
348 Pages 164 B/W Illustrations

 
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Book Description

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.





Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.

Table of Contents

Scattering experiment and structure functions; particles and the correlation function of small-angle scattering. Chord length distribution densities of selected elementary geometric figures. Chord length distributions of infinitely long cylinders. Particle-to-particle interference – a useful tool. Scattering patterns and structure functions of Boolean models. The "Dead Leaves" model. Tessellations, fragment particles and puzzles. Volume fraction of random two-phase samples for a fixed order range L from γ(r,L). Interrelations between the moments of the chord length distributions of random two-phase systems. Exercises on problems of particle characterization: examples.

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Author(s)

Biography

Wilfried Gille

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Author - Wilfried - Gille
Author

Wilfried - Gille

Dr. habil., MLU Halle-Wittenberg
Halle

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Reviews

"This is a useful monograph on applications of observed wave and particle interference patterns to reconstruct structural details of scattering materials. It can equally serve as a comprehensive textbook to graduate students and as a reference book to professionals in the field."
Zentralblatt MATH 1323