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Statistical Modeling of Reliability Structures and Industrial Processes book cover

1st Edition

Statistical Modeling of Reliability Structures and Industrial Processes

Edited By Ioannis S. Trianntafyllou, Mangey Ram Copyright 2023
    246 Pages 54 B/W Illustrations
    by CRC Press

    246 Pages 54 B/W Illustrations
    by CRC Press
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    This reference text introduces advanced topics in the field of reliability engineering, introduces statistical modeling techniques, and probabilistic methods for diverse applications.

    It comprehensively covers important topics including consecutive-type reliability systems, coherent structures, multi-scale statistical modeling, the performance of reliability structures, big data analytics, prognostics, and health management. It covers real-life applications including optimization of telecommunication networks, complex infrared detecting systems, oil pipeline systems, and vacuum systems in accelerators or spacecraft relay stations. The text will serve as an ideal reference book for graduate students and academic researchers in the fields of industrial engineering, manufacturing science, mathematics, and statistics.

    1 Recent extensions of signature representations 2 Review of some shock models in reliability systems 3 Goodness of Fit Exponentiality Test against Light and Heavy Tail Alternatives 4 Some Topics on Optimal Redundancy Allocation Problems in Coherent Systems 5 Unsupervised Learning for Large Scale Data: The ATHLOS Project 6 Monitoring process location and dispersion using the double moving average control chart 7 On the application of fractal interpolation functions within the reliability engineering framework 8 The EWMA Control Chart for lifetime monitoring with failure censoring reliability tests and replacement 9 On the lifetime of <n, f, k> reliability systems 10 A technique for identifying groups of fractional factorial designs with similar properties 11 Structured Matrix Factorization approach for image deblurring 12 Reconfigurable Intelligent Surfaces for Exploitation of the Randomness of Wireless Environments 13 Degradation of reliability of digital electronic equipment over time and redundant hardware-based solutions

    Biography

    Ioannis S. Triantafyllou is an assistant professor in the Department of Computer Science and Biomedical Informatics at the University of Thessaly, Greece. He received his B.S. degree in Mathematics from the University of Athens, Greece in 2002, and the M.Sc. and Ph.D. degrees in Statistics from the University of Piraeus, Greece in 2005 and 2009 respectively. He has served as a referee for more than 20 scientific journals. He has published over 60 peer-reviewed papers in international refereed scientific journals, edited volumes, and conferences. His research interests include Applied Probability, Nonparametric Statistics, Reliability Theory, and Statistical Process Control.

    Mangey Ram received his Ph.D., major in Mathematics and minor in Computer Science from G. B. Pant University of Agriculture and Technology, Pantnagar in 2008. He is an editorial board member in many international journals. He has published 102 research publications in national and international journals of repute. His fields of research are Operations Research, Reliability Theory, Fuzzy Reliability, and System Engineering. Currently, he is working as a Professor at Graphic Era University, Dehradun, India.

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