Surface Analysis of Paper  book cover
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Surface Analysis of Paper



ISBN 9780429279997
Published April 15, 2020 by CRC Press
368 Pages

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Book Description

First published in 1995, Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper.
Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods.
Each chapter contains:

  • An introduction
  • A description of the technique
  • A discussion of the type of information that can be obtained with the particular technique
  • Practical examples to demonstrate the advantages of the technique
  • Table of Contents

    Physical Characterization of Surfaces
    Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy, M.-C. Béland and P.J. Mangin
    Scanning Electron Microscopy: A Tool for the Analysis of Wood Pulp Fibers and Paper, G. de Silveira, P. Forsberg, and T.E. Conners
    Mechanical and Physical Properties of Paper Surfaces, J.F. Waterhouse
    The Surface Chemistry of Paper: Its Relationship to Printability and Other Paper Properties, F.M. Etzler and J.J. Conners
    Brightness Properties of Pulp and Paper, A.J. Ragauskas
    Spectroscopic Methods
    FT-IR Spectroscopy, M.A. Friese and S. Banerjee
    Near-Infrared Spectroscopy of Wood Products, J.M. Pope
    Raman Spectroscopy, U.P. Agarwal and R. Atalla
    Energy-Dispersive X-Ray Spectroscopic Analysis, G. de Silveira and T.E. Conners
    SIMS: Secondary Ion Mass Spectrometry, L.D. Detter-Hoskin and K.L. Busch
    X-Ray Photoelectron Spectroscopy, W.K. Istone
    Emerging Technologies
    Principles of Electron Energy Loss Spectroscopy and Its Application to the Analysis of Paper, G. Botton
    Surface Analysis Using Millimeter-Wave Resonant Instruments, J.S. Martens
    Atomic Force Microscopy, S.J. Hanley and D.G. Gray
    Using the Photon Tunneling Microscope to View Paper Surfaces, T.B. Arnold, T.E. Conners, and G.L. Dyer
    Index

    ...
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    Author(s)

    Biography

    Terrence E. Conners, Sujit Bannerjee

    Reviews

    "I certainly recommend Surface Analysis of Paper as a necessary volume for every reference library, and also for the personal library of any paper researcher who is also a materials scientist."
    -Journal of Pulp and Paper Science, Vol. 2, No. 5, May 1996