Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper.
Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods.
Each chapter contains:
"I certainly recommend Surface Analysis of Paper as a necessary volume for every reference library, and also for the personal library of any paper researcher who is also a materials scientist."
-Journal of Pulp and Paper Science, Vol. 2, No. 5, May 1996
Physical Characterization of Surfaces
Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy, M.-C. Béland and P.J. Mangin
Scanning Electron Microscopy: A Tool for the Analysis of Wood Pulp Fibers and Paper, G. de Silveira, P. Forsberg, and T.E. Conners
Mechanical and Physical Properties of Paper Surfaces, J.F. Waterhouse
The Surface Chemistry of Paper: Its Relationship to Printability and Other Paper Properties, F.M. Etzler and J.J. Conners
Brightness Properties of Pulp and Paper, A.J. Ragauskas
FT-IR Spectroscopy, M.A. Friese and S. Banerjee
Near-Infrared Spectroscopy of Wood Products, J.M. Pope
Raman Spectroscopy, U.P. Agarwal and R. Atalla
Energy-Dispersive X-Ray Spectroscopic Analysis, G. de Silveira and T.E. Conners
SIMS: Secondary Ion Mass Spectrometry, L.D. Detter-Hoskin and K.L. Busch
X-Ray Photoelectron Spectroscopy, W.K. Istone
Principles of Electron Energy Loss Spectroscopy and Its Application to the Analysis of Paper, G. Botton
Surface Analysis Using Millimeter-Wave Resonant Instruments, J.S. Martens
Atomic Force Microscopy, S.J. Hanley and D.G. Gray
Using the Photon Tunneling Microscope to View Paper Surfaces, T.B. Arnold, T.E. Conners, and G.L. Dyer