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Surface-Ionization Drift-Spectrometry



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ISBN 9780367493752
April 12, 2022 Forthcoming by CRC Press
304 Pages 226 B/W Illustrations

 
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Book Description

Surface-Ionization Drift-Spectrometry is devoted to a new drift-spectrometry method using surface ionization of nitrogen-, phosphorus-, arsenic- and sulfur-containing organics. New theoretical approaches are described that successfully combine a surface-ionization source and a drift spectrometer of coaxial type to obtain multi-parameter detection of organic molecules in a single instrument.

This reference examines various versions of the device and the model set of nitrogen, phosphorus, arsenic and sulfur-containing organics result in successful identification of three to seven independent parameters. The authors demonstrate the methods versatility in identifying multiple parameters for electronic materials and devices.

 

Additional features include:

  • Demonstrates a new approach to Time-of-Flight Ion Mobility Spectrometry (TFIMS).
  • Explores alternative methods for High-field Asymmetric Waveform Ion Mobility Spectrometry (FAIMS).
  • Offers readers greater multi-parameter identification, selectivity, and resistance to fluctuations in humidity.

Table of Contents

Traditional methods of drift spectrometry

Theoretical models of surface ionization of organic compounds

Elements of the theory of surface-ionization drift spectrometry

Structures and technologies of surface-ionization

drift spectrometers

Properties of materials for thermoemitters of ions of organic compounds

Research of active centres on the surface of oxidized molybdemum alloys

Research of active centres on the surface of alkali metal oxide bronzes

Surface ionization parameters of organic compounds

Mass spectrometry of the composition of ion current from the surface of ion thermoemitters

Determination of physical and chemical parameters of organic compounds in the ion source of surface-ionization drift spectrometer

Determination of the physical and chemical parameters of organic compounds in the drift camera of a surface-ionization drift spectrometer

Development of laboratory installations of surface-ionization drift spectrometers

Conclusion, References, Index

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Author(s)

Biography

Vladimir I. Kapustin, Professor, Russian Technological University, Moscow, RU Alexey P. Korzhavyi, Professor, Bauman Moscow State Technical University, Moscow, RU