256 pages | 8 Color Illus. | 208 B/W Illus.
This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.
1 Coded Aperture X-Ray Diffraction Tomography
Joel A. Greenberg
2 Semiconductor Sensors for XRD Imaging
Krzysztof Iniewski and Adam Grosser
3 Integrated Circuits for XRD Imaging
4 Applications of X-Ray Diffraction Imaging in Medicine
Manu N. Lakshmanan
5 Materials Science of X-Ray Diffraction
Scott D. Wolter
6 X-Ray Diffraction and Focal Construct Technology
Keith Rogers and Paul Evans
7 X-Ray Diffraction Tomography: Methods and Systems
Shuo Pang and Zheyuan Zhu
8 Energy-Resolving Detectors for XDi Airport Security Systems