X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT  Conference, 31 August-4 September 1992, Manchester, UK  book cover
1st Edition

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

ISBN 9780750302555
Published March 1, 1993 by CRC Press
680 Pages

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Book Description

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

Table of Contents

Cosslett symposium: (speakers T Mulvey, W C Nixon, R W Horne, A Glauert, J V Long, P Duncumb, A Boyde, P W Hawkes). Invited papers: Recent advances in electron microprobe analysis (S J B Reed); Database and review of quantitative EMPA procedures (K F J Heinrich); Atomic resolution incoherent imaging and analysis with the STEM (S J Pennycook et al); The quantitative analysis of thin specimens (D B Williams); Imaging surfaces with scanning tunnelling and scanning force microscopes (H-J Butt); Aspects of 3-D imaging, display and measurement in light and scanning electron microscopy (A Boyde); Developments in image processing (P W Hawkes). Never mind the baby, how about the bath water?: insights from the secondary electron background in electron spectroscopy (J A D Matthew et al); The use of integrated circuits for position-sensitive detection (J Comer et al); Surface studies in UHV-SEM and STEM (J A Venables et al); Electron spectroscopy at high spatial resolution (P Kruit); The performance of the photoelectron spectromicroscope at low and high energies (D W Turner and I R Plummer); Laser-plasma XUV sources, advances in performance (F Bijkerk); X-ray microprobes based on Bragg-Fresnel crystal optics for high energy X-rays (V V Aristov et al); X-ray holography at the National Synchrotron Ligh Source (C Jacobsen et al); Review on the development of cone-beam X-ray microtomography (P C Cheng et al); The opportunities and challenges of using high brilliance X-ray synchotron sources (P Pattison); Present status of and future prospects for synchotron-based microtechniques that utilize X-ray fluorescence, absorption spectroscopy, diffraction and tomography (J V Smith); Properties and applications of soft x-ray undulators in structural and microstructural studies of the surfaces of materials (D P Woodruff); Review of EPMA and future developments (K F J Heinrich).

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