Applied Measurement with jMetrik

By J. Patrick Meyer

© 2014 – Routledge

149 pages | 55 B/W Illus.

Purchasing Options:
Paperback: 9780415531979
pub: 2014-06-24
US Dollars$46.95
x
Hardback: 9780415531955
pub: 2014-06-26
US Dollars$160.00
x

Look Inside e–Inspection Copy

About the Book

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

Table of Contents

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

About the Author

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Subject Categories

BISAC Subject Codes/Headings:
EDU000000
EDUCATION / General
EDU027000
EDUCATION / Statistics
EDU030000
EDUCATION / Testing & Measurement
EDU037000
EDUCATION / Research