This work represents a sound introduction to the fundamental principles of infrared microspectroscopy (IMS). It describes how IMS is used to solve specific microanalytical problems in a variety of disciplines, including forensic analysis, art conservation, and geological, pharmaceutical and electronics research. The book discusses when and how to use special techniques such as line scanning, 3-dimensional imaging and attenuated total reflection and grazing-angle spectroscopy.
Preface
Contributors
Minimizing Optical Nonlinearities in Infrared Microspectroscopy
Robert G. Messerschmidt
Uniting Microscopy and Spectroscopy
John A. Reffner and Pamela A. Martoglio
Infrared Microimaging
K. Krishnan, Jay R. Powell, and Stephen L. Hill
Applications of Reflectance Microspectroscopy in the Electronics Industry
Catherine A. Chess
Depth Profiling and Defect Analysis of Films and Laminates: An Industrial Approach
Richard W. Duerst, William L. Stebbings, Gerald J. Lillquist, James W. Westberg, William E. Breneman, Colleen K. Spicer, Rebecca M. Dittmar, Marlyn D. Duerst, and John A. Reffner
Infrared Microspectroscopy of Forensic Paint Evidence
Scoot G. Ryland
Forensic Examination of Synthetic Textile Fibers by Microscopic Infrared Spectrometry
Mary W. Tungol, Edward G. Bartrick, and Akbar Montaser
Infrared Microspectroscopy in the Analysis of Cultural Artifacts
Michele R. Derrick
Pharmaceutical Applications of Infrared Microspectroscopy
D. Scott Aldrich and Mark A. Smith
Infrared Microspectroscopy in Earth Science
Anne M. Hofmeister
Unique Preparation techniques for Nanogram Samples
Anna S. Teetsov
Microsample Preparation Techniques
Howard J. Humecki
Index
Biography
Howard J. Humecki
". . .the book contains a valuable collection of information for the infrared microspectroscopist. . .the Practical Guide to Infrared Microspectroscopy has something for every IR microspectroscopist. "
---Applied Spectroscopy
