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Recent Advances in Life-Testing and Reliability

1st Edition

By N. Balakrishnan,H. Leon Harter,Jon E. Anderson,Ananda Sen,Claudio Benski,William Q. Meeker,Philip Prescott,Richard L. Smith,J.R.M. Hosking,Gary C. McDonald,Diane I. Gibbons,Lonnie C. Vance,Edsel A. Pena,Michael Hamada,Nelson O. Wood,Peter R. Nelson,Max Engelhardt,Necip Doganaksoy,Jeffrey A. Robinson,Harry F. Martz,Gouri K. Bhattacharyya,Wayne Nelson,Nader Ebrahimi,Asit P. Basu,Gemai Chen,Shelemyahu Zacks,Alec Feinberg,Emmanuel Cabau,Richard R. Prairie,Christian G. Garrigoux,David Green,James W. Evans,T.J. Bedford,Barry C. Arnold,M.V. Koutras,S. G. Papastavridis,Kyriakos I. Petakos,Greg Gibson,D. Bandyopadhyay,Roger Cooke,K.B. Kulasekera,Robert L. Parker,Chris P. Tsokos,Alan Widom,William J. Zimmer,Kazuyuki Suzuki,Richard E. Barlow,Richard A. Johnson,Piug-Shing Chen

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