This book documents the proceedings of the Second International Symposium on Adhesion Measurement of Films and Coatings, held in Newark, NJ, October 25-27, 1999. Since the First Symposium (Boston 1992) there had been considerable activity in devising new, more reliable and more efficient ways to measure adhesion of films and coatings, which resulted in the decision to organize the Newark Symposium. Films and coatings are used for a variety of purposes â€“ functional, decorative, protective, etc. â€“ in a host of applications. Irrespective of the purpose or application of a film or a coating, their adequate adhesion to the underlying substrates is of paramount importance. Concomitantly, the need to develop techniques for quantitative assessment of adhesion of films and coatings is all too obvious. This volume contains a total of 20 papers, which have all been rigorously peer reviewed and suitably modified before inclusion. The topics include: measurement and analysis of interface adhesion; relative adhesion measurement for thin film structures; adhesion testing of hard coatings by a variety of techniques; challenges and new directions in scratch adhesion testing of coated substrates; application of scratch test to different films and coatings; evaluation of coating-substrate adhesion by indentation experiments; measurement of interfacial fracture energy in multifilm applications; laser induced decohesion spectroscopy (LIDS) for measuring adhesion; pulsed laser technique for assessment of adhesion; blade adhesion test; JKR adhesion test; coefficient of thermal expansion measurement; and residual stresses in diamond films. This volume, providing the latest information, will be of great value and interest to anyone working in the area of adhesion measurement of films and coatings.
Preface Interface adhesion: Measurement and analysis A.G. Evans Relative adhesion measurement for thin film microelectronic structures. Part II. L.P. Buchwalter Testing the adhesion of hard coatings including the non-destructive technique of surface acoustic waves H. Ollendorf, T. SchÃ¼lke and D. Schneider Scratch adhesion testing of coated surfaces â€“ Challenges and new directions J. Meneve, H. Ronkainen, P. Andersson, K. Vercammen, D. Camino, D.G. Teer, J. von Stebut, M.G. Gee, N.M. Jennett, J. Banks, B. Bellaton, E. Matthaei-Schulz and H. Vetters Can the scratch adhesion test ever be quantitative? S.J. Bull Characterisation of thin film adhesion with the Nano-Scratch Tester (NST) J.D. Holbery and R. Consiglio Scratch adhesion testing of nanophase diamond coatings on industrial substrates F. Davanloo, C.B. Collins and K.J. Koivusaari Scratch test failure modes and performance of organic coatings for marine applications S.J. Bull, K. Horvathova, I.P. Gilbert, D. Mitchell, R.I. Davidson and J.R. White An energetic approach for the evaluation of adhesion of sputter deposited TiC films on glass by the scratch test A. Kinbara, A. Sato, E. Kusano and N. Kikuchi On the evaluation of coating-substrate adhesion by indentation experiments B. Rother Measurement of interfacial fracture energy in microelectronic multifilm applications J.C. Hay, E.G. Liniger and X.H. Liu Assessment of adhesion reliability for plastic flip-chip packaging X. Dai, M.V. Brillhart and P.S. Ho Adhesion and abrasion of sputter-deposited ceramic thin films on glass S. Suzuki Improvement and testing of diamond film adhesion X.C. He, H.S. Shen, Z.M. Zhang, X.J. Hu and X.Q. Yang Effect of primer curing conditions on basecoat-primer adhesion â€“ A LIDS study J.S. Meth Evaluation of a pulsed laser technique for the estimation of the adhesion strength of oxide coatings onto metallic substrates G. Rosa, P. Psyllaki and R. Oltra The blade adhesion test applied to polyimide films onto silicon substrate S. Khasawinah and C.G. Smith Mechanics of the JKR (Johnson-Kendall-Roberts) adhesion test C.Y. Hui, J.M. Baney and Y.Y. Lin Revisiting bimaterial curvature measurements for CTE of adhesives D.A. Dillard and J.-H. Yu Raman spectroscopic determination of residual stresses in diamond films Q.H. Fan, J. GrÃ¡cio and E. Pereira