1st Edition
Atomic Force Microscopy Fundamental Concepts and Laboratory Investigations
By Wesley Sanders
Copyright 2020
153 Pages
89 B/W Illustrations
by
CRC Press
153 Pages
89 B/W Illustrations
by
CRC Press
153 Pages
89 B/W Illustrations
by
CRC Press
Also available as eBook on:
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the... Read more
1. Introduction to Atomic Force Microscopy
2. Tip-Sample Forces
3. AFM Electronics
4. AFM Cantilevers and Probes
5. Contact Mode AFM
6. Lateral Force Microscopy
7. Conductive Atomic Force Microscopy
8. Oscillating Modes of AFM
9. Image Processing
Biography
Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.
