Capacitance Spectroscopy of Semiconductors: 1st Edition (Hardback) book cover

Capacitance Spectroscopy of Semiconductors

1st Edition

Edited by Jian V. Li, Giorgio Ferrari

Jenny Stanford Publishing

444 pages | 15 Color Illus. | 169 B/W Illus.

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pub: 2018-06-21
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Description

Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

Table of Contents

Introduction to Capacitance Spectroscopy

Jian V. Li and Jennifer T. Heath

Admittance Spectroscopy

Thomas Walter

Deep-Level Transient Spectroscopy

Johan Lauwaert and Samira Khelifi

Capacitance-Voltage and Drive-Level-Capacitance Profiling

Jennifer T. Heath

Basic Techniques for Capacitance and Impedance Measurements

Giorgio Ferrari and Marco Carminati

Advanced Instrumentation for High-Resolution Capacitance and Impedance Measurements

Giorgio Ferrari and Marco Carminati

Time-Domain-Based Impedance Detection

Uwe Pliquett

Comparison of Capacitance Spectroscopy for PV Semiconductors

Adam Halverson

Capacitive Techniques for the Characterization of Organic Semiconductors

Dario Natali and Mario Caironi

Capacitance Spectroscopy for MOS Systems

Salvador Duenas and Helena Castan

Capacitance Spectroscopy in Single-Charge Devices

Alessandro Crippa, Marco Tagliaferri, and Enrico Prati

Scanning Capacitance Microscopy

Jian V. Li and Chunsheng Jiang

Probing the Dielectric Constant at the Nanoscale with Scanning Probe Microscopy

Laura Fumagalli and Gabriel Gomila

SPM-Based Capacitance Spectroscopy

Jian V. Li, Giorgio Ferrari, and Chunsheng Jiang

Scanning Microwave Microscopy

Yongtao Cui and Eric Ma

About the Editors

Jian V. Li holds a PhD in electrical engineering from the University of Illinois at Urbana-Champaign, USA. Since 2017, he has been an associate professor at National Cheng Kung University, Taiwan. He specializes in the characterization of semiconductor materials and devices—especially properties concerning defects, carrier recombination, and interfaces—with capacitance spectroscopy and other electrical–optical techniques.

Giorgio Ferrari obtained his PhD in electronics engineering in 2003 from the Politecnico di Milano, Italy. Since 2005, he has been an assistant professor of electronics at the Politecnico di Milano. His research concerns the development of novel integrated instrumentation to probe electrical properties of materials, devices, and biosamples at the nanoscale.

Subject Categories

BISAC Subject Codes/Headings:
SCI078000
SCIENCE / Spectroscopy & Spectrum Analysis
TEC008070
TECHNOLOGY & ENGINEERING / Electronics / Microelectronics
TEC021000
TECHNOLOGY & ENGINEERING / Material Science