1st Edition

Capacitance Spectroscopy of Semiconductors

Edited By Jian V. Li, Giorgio Ferrari Copyright 2018
    460 Pages 15 Color & 169 B/W Illustrations
    by Jenny Stanford Publishing

    460 Pages 15 Color & 169 B/W Illustrations
    by Jenny Stanford Publishing

    Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

    Introduction to Capacitance Spectroscopy

    Jian V. Li and Jennifer T. Heath

    Admittance Spectroscopy

    Thomas Walter

    Deep-Level Transient Spectroscopy

    Johan Lauwaert and Samira Khelifi

    Capacitance-Voltage and Drive-Level-Capacitance Profiling

    Jennifer T. Heath

    Basic Techniques for Capacitance and Impedance Measurements

    Giorgio Ferrari and Marco Carminati

    Advanced Instrumentation for High-Resolution Capacitance and Impedance Measurements

    Giorgio Ferrari and Marco Carminati

    Time-Domain-Based Impedance Detection

    Uwe Pliquett

    Comparison of Capacitance Spectroscopy for PV Semiconductors

    Adam Halverson

    Capacitive Techniques for the Characterization of Organic Semiconductors

    Dario Natali and Mario Caironi

    Capacitance Spectroscopy for MOS Systems

    Salvador Duenas and Helena Castan

    Capacitance Spectroscopy in Single-Charge Devices

    Alessandro Crippa, Marco Tagliaferri, and Enrico Prati

    Scanning Capacitance Microscopy

    Jian V. Li and Chunsheng Jiang

    Probing the Dielectric Constant at the Nanoscale with Scanning Probe Microscopy

    Laura Fumagalli and Gabriel Gomila

    SPM-Based Capacitance Spectroscopy

    Jian V. Li, Giorgio Ferrari, and Chunsheng Jiang

    Scanning Microwave Microscopy

    Yongtao Cui and Eric Ma


    Jian V. Li holds a PhD in electrical engineering from the University of Illinois at Urbana-Champaign, USA. Since 2017, he has been an associate professor at National Cheng Kung University, Taiwan. He specializes in the characterization of semiconductor materials and devices—especially properties concerning defects, carrier recombination, and interfaces—with capacitance spectroscopy and other electrical–optical techniques.

    Giorgio Ferrari obtained his PhD in electronics engineering in 2003 from the Politecnico di Milano, Italy. Since 2005, he has been an assistant professor of electronics at the Politecnico di Milano. His research concerns the development of novel integrated instrumentation to probe electrical properties of materials, devices, and biosamples at the nanoscale.

    "This book provides a comprehensive review of all the important aspects of capacitance spectroscopy techniques, including fundamental principles, instrumentation overview, practical applications, and the latest emerging techniques. It is well organized and easy to read. Its rich information is useful for both professional researchers and undergraduate- and graduate-level students in physics, chemistry, and materials science and engineering." – Prof. Yanfa Yan, University of Toledo, USA