2nd Edition

Electrostatic Lens Systems, 2nd edition

ISBN 9780750306973
Published December 13, 2000 by CRC Press
138 Pages - 42 B/W Illustrations

USD $205.00

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Book Description

Electrostatic Lens Systems: Second Edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method, developed by the author and his students, and the nine-point implementation of the finite difference method. Demonstration programs of other methods can be found via the websites provided. A chapter on aberrations presents formulae that enable the coefficients to be determined by an extension to the ray tracing procedures, demonstrating optimum conditions for lens operation.

The book is accompanied by a disk that provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements. These programs are of value even to experienced workers in the field who may be quite familiar with much of the material in the text.

Table of Contents

The optics of simple lenses. The motion of charged particles in an electrostatic field. The determination of the axial potential. The optics of simple lens systems. Aberrations. The LENSYS program. Technical aspects of LENSYS. References.

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Praise for the previous edition:
"… this book is a very useful companion to the SIMION program for the design of low energy particle optics."
-Australian and New Zealand Physicist

"Good value for money for those purchasers who want a computer-based learning aid along with a well written supporting text."
-Optics and Lasers in Engineering

"These programs will be of value even to experienced workers in the field who may be quite familiar with much of the material in the text."
-W. Steckelmacher, Elsevier Science, INSPEC