Extreme Environment Electronics: 1st Edition (Paperback) book cover

Extreme Environment Electronics

1st Edition

Edited by John D. Cressler, H. Alan Mantooth

CRC Press

1,041 pages | 976 B/W Illus.

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Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space.

The Definitive Guide to Extreme Environment Electronics

Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics.

Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material.

With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.


"It is an excellent reference book in a somewhat specialized field. … This book details a lot of stuff not really documented anywhere else. It is likely to be ‘the’ book on this subject."

—Marco Corsi, Texas Instruments, Parker, Texas, USA

"This book is a comprehensive compendium of valuable information on the operation of electronics in extreme environments. It contains contributions from more than 100 experts in all of the appropriate fields of study. … a very large number of practical examples and applications. It will be valuable for students and for practicing engineers, scientists, and technical managers."

—Edward Petersen, Ph.D., IEEE Life Fellow, consultant, and author of Single Event Effects in Aerospace

"… a very large and comprehensive collection of modern electronic circuits generally used in space applications. … the authoritative guide to extreme environment electronics. loaded with a wealth of information. It will provide engineers and scientists working in this field with up-to-elate information and provide a comprehensive listing of reference sources for further study. It could also be useful to graduate students studying electrical engineering, physics or material science."

—IEEE Electrical Insulation Magazine

Table of Contents

Part I Introduction

Big Picture and Some History of the Field

John D. Cressler

Extreme Environments in NASA Planetary Exploration

Elizabeth Kolawa, Mohammad Mojarradi, and Linda Del Castillo

Extreme Environment Electronics in NASA’s Heliophysics Vision

Dana Brewer and Janet Barth

Overview of the NASA ETDP RHESE Program

Andrew S. Keys

Role of Extreme Environment Electronics in NASA’s Aeronautics Research

Gary W. Hunter and Dennis Culley

Technology Options for Extreme Environment Electronics

Jonathan A. Pellish and Lewis M. Cohn

Part II Background


John D. Cressler

Physics of Temperature and Temperature’s Role in Carrier Transport

John D. Cressler and Kurt A. Moen

Overview of Radiation Transport Physics and Component Effects

Robert Reed and Janet Barth

Interaction of Radiation with Semiconductor Devices

Ken F. Galloway and Ron D. Schrimpf

Part III Environments and Prediction Tools


John D. Cressler

Orbital Radiation Environments

Michael Xapsos

CRÈME96 and Related Error Rate Prediction Methods

James H. Adams, Jr.

Monte Carlo Simulation of Radiation Effects

Robert A. Weller

Extreme Environments in Energy Production and Utilization

Alexander B. Lostetter

Extreme Environments in Transportation

Peter Wilson and H. Alan Mantooth

Part IV Semiconductor Device Technologies for Extreme Environments


John D. Cressler

Radiation Effects in Si CMOS Platforms

Lloyd W. Massengill

Wide Temperature Range Operation of Si CMOS Platforms

Aravind C. Appaswamy

Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies

Rajan Arora

SiGe HBT Platforms

John D. Cressler

Using Temperature to Explore the Scaling Limits of SiGe HBTs

Jiahui Yuan

SiC Integrated Circuit Platforms for High-Temperature Applications

Philip G. Neudeck

Passive Elements in Silicon Technology

Edward P. Wilcox

Power Device Platforms

H. Alan Mantooth

CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments

Trevor J. Thornton, William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Asha Balijepalli, and Joseph Ervin

III-Nitride Platforms

Shyh-Chiang Shen

Photonic Devices

Cheryl J. Marshall

Radiation Hardening by Process

Michael L. Alles

Rad-Hard Silicon Technologies at BAE Systems

Richard W. Berger

Rad-Hard Silicon Technologies at Honeywell

Paul S. Fechner and Jerry Yue

High-Temperature SOI Technologies at Honeywell

Bruce Ohme

Part V Modeling for Extreme Environment Electronic Design


H. Alan Mantooth

TCAD of Advanced Transistors

Guofu Niu

Mixed-Mode TCAD Tools

Ashok Raman and Marek Turowski

Mixed-Mode TCAD for Modeling of Single-Event Effects

Kurt A. Moen and Stanley D. Phillips

Compact Modeling of SiGe HBTs

Guofu Niu and Lan Luo

Compact Modeling of CMOS Devices for Extreme Environments

A. Matt Francis

Compact Modeling of LDMOS Transistors

Avinash S. Kashyap

Compact Modeling of Power Devices

Ty R. McNutt

Best Practices for Modeling Radiation Effects in Mixed Signal Circuits

Jeffrey S. Kauppila

Compact Model Toolkits

Jim Holmes and A. Matt Francis

Part VI Device and Circuit Reliability in Extreme Environments


John D. Cressler

Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions

Fernando Guarin

Considerations for the Reliability Estimation of SiGe HBTs

Fernando Guarin

Considerations for the Reliability Estimation of Silicon CMOS

Stewart Rauch

Qualification Methodology for Extreme Environment Electronics

Yuan Chen

Part VII Circuit Design for Extreme Environments


H. Alan Mantooth

Best Practices in Radiation Hardening by Design

Jeffrey D. Black

Investigations of RHBD Techniques for SiGe Devices and Circuits

Stanley D. Phillips

Best Practices in Wide Temperature Range Circuit Design

Benjamin J. Blalock

Achieving Invariability in Analog Circuits Operating in Extreme Environments

Peter Wilson, Robert Rudolf, and Reuben Wilcock

Part VIII Examples of Extreme Environment Circuit Designs


H. Alan Mantooth

Voltage and Current References

Laleh Najafizadeh

Operational Amplifiers

Benjamin J. Blalock

Cryogenic Low-Noise Amplifiers

Joseph C. Bardin

Active Filters

Fa Foster Dai and Desheng Ma

Analog-to-Digital Converters

Benjamin J. Blalock

Digital-to-Analog Converters

Fa Foster Dai, Yuan Yao, and Zhenqi Chen

CMOS Phase-Locked Loops

T. Daniel Loveless

Low-Voltage, Weakly Saturated SiGe HBT Circuits

Sachin Seth

Memory Circuits

Richard W. Berger

Field Programmable Gate Arrays

Melanie Berg

Microprocessors and Microcontrollers

Ken Li and Michael Johnson

Asynchronous Digital Circuits

Jia Di and Scott C. Smith

Characterizing SETs in Oscillator Circuits

Stephen J. Horst

Low-Voltage Power Electronics

Mohammad Mojarradi and Philippe Adell

Medium-Voltage Power Electronics

Marcelo Schupbach

SiC JFET Integrated Circuits for Extreme Environment Electronics

Philip G. Neudeck, Michael J. Krasowski, and N. F. Prokop

Using CMOS-Compatible SOI MESFETs for Power Supply Management

William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Michael Goryll, Keith Hobert, Bertan Bakkaloglu, and Trevor J. Thornton

Part IX Verification of Analog and Mixed-Signal Systems


H. Alan Mantooth

Model-Based Verification

Jim Holmes

Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification

Chip Webber

Part X Packaging for Extreme Environments


John D. Cressler

Electronic Packaging Approaches for Low-Temperature Environments

R. Wayne Johnson

Electronic Packaging Approaches for High-Temperature Environments

R. Wayne Johnson

Failure Analysis of Electronic Packaging

Linda Del Castillo

Silicon Carbide Power Electronics Packaging

Jared Hornberger, Brice McPherson, and Brandon Passmore

Part XI Real-World Extreme Environment Applications


H. Alan Mantooth

A SiGe Remote Sensor Interface

Ryan M. Diestelhorst

A SiGe Remote Electronics Unit

Troy D. England

Distributed Motor Controller for Operation in Extreme Environments

Colin McKinney

Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment

Shahid Aslam, Akin Akturk, and Gerard Quilligan

Approaches to Commercial Communications Satellite Design

David A. Sunderland

UHF Micro-Transceiver Development Project

William Bill Kuhn and Yogesh Tugnawat

Down-Hole Instrumentation Package for Energy Well Drilling

Randy Normann

Electronics Requirements for Collider Physics Experiments

Alexander A. Grillo

Cryogenic Electronics for High-Energy Physics Experiments

Veljko Radeka, Gianluigi de Geronimo, and Shaorui Li

Radar Systems for Extreme Environments

Tushar Thrivikraman

Part XII Appendices

Appendix A: Properties of Silicon and Germanium

John D. Cressler

Appendix B: Temperature and Energy Scales

John D. Cressler

Appendix C: Planetary Temperature Ranges and Radiation Levels

H. Alan Mantooth

Appendix D: Ionizing Radiation Test Facilities

Paul W. Marshall

Appendix E: Radiation Testing Protocols and Mil-Spec Standards

Ronald Pease

Appendix F: Primer on the Semiconductor Transport Equations and Their Solution

Guofu Niu

Appendix G: Primer on MOSFETs

H. Alan Mantooth

Appendix H: Primer on Si and SiGe Bipolar Transistors

John D. Cressler

Appendix I: Compendium of NASA’s COTS Radiation Test Data

Martha O’Bryan

Appendix J: Compendium of NASA’s COTS Cryogenic Test Data

Richard L. Patterson and Ahmad Hammoud


About the Editors

John D. Cressler is currently Ken Byers Professor of Electrical and Computer Engineering at Georgia Tech.

H. Alan Mantooth is a Distinguished Professor of Electrical Engineering and the holder of the 21st Century Endowed Chair in Mixed-Signal IC Design and CAD at the University of Arkansas.

About the Series

Industrial Electronics

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Subject Categories

BISAC Subject Codes/Headings:
TECHNOLOGY & ENGINEERING / Electronics / General
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General