Review of ZrO/W Schottky Cathode
L. W. Swanson and G. A. Schwind
Liquid Metal Ion Sources
R. G. Forbes and (the late) G. L. R. Mair
Gas Field Ionization Sources
R. G. Forbes
Magnetic Lenses for Electron Microscopy
K. Tsuno
Electrostatic Lenses
B. Lencová
Aberrations
P. W. Hawkes
Space Charge and Statistical Coulomb Effects
P. Kruit and G. H. Jansen
Resolution
M. Sato
Scanning Electron Microscope
A. E. Vladár and M. T. Postek
Scanning Transmission Electron Microscope
A. V. Crewe (updated by P. D. Nellist)
Focused Ion Beams
M. Utlaut
Aberration Correction in Electron Microscopy
O. L. Krivanek, N. Dellby and M. F. Murffitt
Appendix: Computational Resources for Electron Microscopy
J. Orloff (with valuable information from P. W. Hawkes and B. Lencová)
Index
Biography
Jon Orloff
… In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning electron microscopes or scanning transmission electron microscopes. … The index is very comprehensive and helps in making the book a valuable reference. Although the text comes from 18 different authors each with their individual style, it is nevertheless well written and clear throughout. The eight unnumbered colour pages at the centre of the book are also a nice feature. Altogether, the book is valuable for experts and those who want to become experts concerned with the design and understanding of charged particle optics as used in electron microscopy. Owing to the rigorous mathematical treatment of particle optical effects, it will also help in the analysis of observed effects such as aberrations and their correction, space charge effects, as well as issues concerning the resolution obtained in microscopy.
—Manuel Vogel, Contemporary Physics, Vol. 51, Issue 4, July 2010
