The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors’ firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.
Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.
New Information in this Second Edition Includes:
Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications—the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.
This handbook on surface and interface analysis can help to create that knowledgeable person … sufficient in-depth technical information to satisfy those who want to know the details … Material scientists, engineers, materials researchers, or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use.
—IEEE Electrical Insulation Magazine, Vol. 26, No. 3, May-June 2010
Introduction, J. C. Rivière and S. Myhra
Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Rivière
Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund
Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading
Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra
Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments
J. M. Titchmarsh
Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince
Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard
Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh
In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell
Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston
Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin
Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild
Composites, P. M. A. Sherwood
Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang
Catalyst Characterization, W. E. S. Unger and T. Gross
Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser
Adhesion Science and Technology, J. F. Watts
Electron Spectroscopy in Corrosion Science, J. E. Castle