Memory, Microprocessor, and ASIC: 1st Edition (Hardback) book cover

Memory, Microprocessor, and ASIC

1st Edition

Edited by Wai-Kai Chen

CRC Press

384 pages | 277 B/W Illus.

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Hardback: 9780849317378
pub: 2003-03-26
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Description

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.

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Table of Contents

System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories. Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal Integrity Analysis. Microprocessor Design Verification. Microprocessor Layout Method. Architecture. ASIC Design. Logic Synthesis for Field Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT. ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.

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About the Series

Principles and Applications in Engineering

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Subject Categories

BISAC Subject Codes/Headings:
TEC007000
TECHNOLOGY & ENGINEERING / Electrical
TEC008000
TECHNOLOGY & ENGINEERING / Electronics / General
TEC008010
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General