1st Edition
Optical Techniques for Solid-State Materials Characterization
BACKGROUND: Light-Matter Interactions. Semiconductors and Their Nanostructures. The Optical Properties of Metals: From Wideband to Narrowband Materials. LINEAR OPTICAL SPECTROSCOPY: Methods for Obtaining the Optical Constants of a Material. Methods for Obtaining the Optical Response after CW Excitation. Raman Scattering as a Tool for Studying Complex Materials. TIME-RESOLVED OPTICAL SPECTROSCOPY: Ultrashort Pulse Generation and Measurement. Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation. Ultrafast Pump-Probe Spectroscopy. Transient Four-Wave Mixing. Time-Domain and Ultrafast Terahertz Spectroscopy. Time-Resolved Photoluminescence Spectroscopy. Time-Resolved Magneto-Optical Spectroscopy. Time-Resolved Raman Scattering. SPATIALLY RESOLVED OPTICAL SPECTROSCOPY: Microscopy. Micro-Optical Techniques. Near-Field Scanning Optical Microscopy. RECENT DEVELOPMENTS: Recent Developments in Spatially and Temporally Resolved Optical Characterization of Solid-State Materials. Index.
Biography
Rohit P. Prasankumar is a technical staff member in the Center for Integrated Nanotechnologies at Los Alamos National Laboratory. He earned a Ph.D. in electrical engineering from the Massachusetts Institute of Technology. His research focuses on the measurement of dynamics in complex functional materials with high temporal and spatial resolution over a broad spectral range.
Antoinette (Toni) J. Taylor is the leader of the Materials Physics and Applications Division at Los Alamos National Laboratory (LANL), where she was awarded the Los Alamos Fellow’s Prize for Outstanding Leadership in Science and Engineering. She is a fellow of LANL, the American Physical Society, the Optical Society of America, and the American Association for the Advancement of Science. Her research interests include the investigation of ultrafast dynamical nanoscale processes in materials and the development of novel optics-based measurement techniques for understanding new phenomena.
This book has comprehensively covered the essential optical approaches needed for solid-state materials characterization. Written by experts in the field, this will be a great reference for students, engineers, and scientists.
—Professor Yoke Khin Yap, Michigan Technical University
