1st Edition

Particles on Surfaces Detection: Adhesion, and Removal

Edited By K.L. Mittal Copyright 1994
438 Pages
by CRC Press

440 Pages
by CRC Press

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the... Read more

Preface

Particles on Surface: Adhesion Induced Deformations

D. S. Rimai, L. P. DeMejo, R. Bowen, and J. D. Morris

Surface Force Tensile Interactions Between Micrometer Size Particles and a Polyester-PDMS Block Copolymer Substrate

L. P. DeMejo, D. S. Rimai, J. H. Chen, and R. Bowen

Polymer to Particle Adhesion Probed with Atomic Force Microscopy

H. Mizes, K. –G. Loh, M. L. Ott, and R. J. D. Miller

Surface Particle Contamination Identification in Microelectronics

M. Simard-Nomandin

An Overview of Spacecraft Particulate Contamination Phenomena

M. C. Fong, A. L. Lee, and P. T. Ma

Contamination on Optical Surfaces—Concerns, Prevention, Detection, and Removal

J. M. Bennett

An Advanced Surface Particle and Molecular Containment Identification, Removal, and Collection System

S. P. Hotaling and D. A. Dykeman

The Role of Air Ionization in Reducing Surface Contamination by Particles in the Cleanroom

S. Gehlke and A. J. Steinman

Selecting a Contamination-Free Deburring Process: Testing Abrasive Blasting Media

W. L. Prater, G. J. Stone, and G. J. Chung

Particle Generation and Control in Tubing and Piping Connection Design

M. Alberg

Detection and Identification of Particles on Silicon Surfaces

T. Hattori

The Characterization of Particles on Spacecraft Returned from Orbit

E. R. Crutcher

A Light-Scattering Method for Determining the Composition of Particles on Surfaces

L. D. Lamb, J. D. Lorentzen, and D. R. Huffman

Light Scattering by Spherical Particles on Planar Multi-Layered Substrates

A. Cangellaris and F. I. Assi

New Test Procedure for the Examination of the Particulate Cleanliness of Technical Surfaces

H. –J. Warnecke and B. Klumpp

Discrimination Between Particulate and Film Type Contamination on Surfaces by Means of Total Reflection X-Ray Fluorescence Spectrometry

H. Schwenke and J. Knoth

Particle Characterization on Surfaces by Auger Electron Spectroscopy

W. F. Stickle, D. Paul, and L. A. LaVanier

Interrogating the Behavior of Micrometer-Sized Particles on Surfaces with Focused Acoustic Waves

G. J. Brereton and B. A. Bruno

Removal of Glass Particles from Glass Surfaces: A Review

A. Ghosh and W. P. Ryszytiwskyj

Particle Removal Characteristics of Surface Cleaning Methods Involving Sonication and/or Spray Impingement

R. Nagarajan

Fluid Dynamics of Liquid Jets Used for Particle Removal from Surfaces

R. Gim, T. Lesniewski, and S. Middleman

Enhanced Particle Removal from Inertial Guidance Instrument Parts by Fluorocarbon Surfactant Solutions

R. Kaiser

Laser Cleaning Techniques for the Removal of Small Surface Particulates

A. C. Tam, W. P. Leung, and W. Zapka

Index

Biography

K.L.Mittal