1. Radiation Effects and RHBD Techniques
2. Rad-hard Voltage References (BGR)
3. Rad-hard Digital-to-Analog Converters (DAC)
4. Rad-hard Analog-to-Digital Converters (ADC)
5. Testing of Rad-hard Analog Devices Under Radiations
Biography
Dr. Umberto Gatti was born in Pavia (Italy) in 1962. He received Laurea and Ph.D. degrees in electronics engineering from the University of Pavia in 1987 and 1992, respectively. From 1993 to 1999, he worked in the R&D Lab of Italtel, as ASIC Designer, and was involved in modeling analog ICs. In 1999, he joined the Development Technologies Lab of Siemens, where he was Sr. Design ASIC Engineer. Besides developing telecom ICs, he was the coordinator of Eureka-Medea+ projects focused on high-speed sigma-delta converters. In 2008 he moved to Nokia Siemens Networks where he worked as Sr. Power Supply Architect. Since 2012 he has been with RedCat Devices as a member of the executive staff. During his career he has been involved in the design of data-converters, broadband wireless transceivers, Hall sensors micro-systems and power supply architectures. His current research interests are in rad-hard CMOS ICs, particularly rad-hard libraries and memories (SRAMs and OTP), rad-hard mixed-signal circuits (ADC-DAC), rad-hard linear voltage regulators, and in testing such components. He holds 2 international patents and is co-author of about 60 papers and one book. He is Senior Member of IEEE and serves also as reviewer for magazines and conferences.
Cristiano Calligaro received his laurea degree in electronics engineering and his Ph.D. degree in electronics and information technology engineering from the University of Pavia (Italy) in 1992 and 1997 respectively. In 2006 he established RedCat Devices srl as a start-up. During his career he has been involved in memory design (volatile and non-volatile) both for consumer application (multilevel flash memories) and space applications (rad-hard memories) and software design for SEE/TID evaluation using open source EDA tools. His current research interest is focused on rad-hard standard cell libraries to be used for rad-hard mixed signal ASICs, stand-alone memory compilers and testing methodologies for rad-hard components. He holds more than 20 patents mainly in the field of multilevel NVMs and he is co-author of more than 60 papers and one book (Rad-hard Semiconductor Memories, River Publishers). He has been coordinator of RAMSES and ATENA projects inside the Italy–Israel Cooperation Programme, SkyFlash project in the European FP7 Programme, EuroSRAM4Space project in the Eureka Eurostars Programme and RADPROM project funded by Italian Space Agency (ASI). He is an IEEE Senior Member and an IEEE Transactions on Nuclear Science reviewer.
