1st Edition
Realizing Complex Integrated Systems
Chapter 1 An Overview of Complex System Design
John W. Sheppard
PART 1 System Planning
Chapter 2 Requirements Types – Design and Test
Satyajit “Sat” Ketkar and Jason Smith
Chapter 3 Project Planning
Lila Carden
Chapter 4 System Decomposition
Satyajit “Sat” Ketkar and Jason Smith
Chapter 5 Systems Engineering Vee
Satyajit “Sat” Ketkar and Jason Smith
Chapter 6 Economics of Design and Test
Anthony P. Ambler
Chapter 7 Cyber‑Physical Systems
Wm. Arthur Conklin
Chapter 8 Logistics and Supply Chain Management
Matthew Hu, Margaret Kidd, Zheyong Bian, Kailai Wang, Harjot Singh Pooni, and Suhaib Kaissi
PART 2 System Design
Chapter 9 Chip-Level Design and Test
Mark McDermott
Chapter 10 Board‑Level Design and Test
Datong Liu, Dawei Pan, and Shengwei Meng
Chapter 11 Power Distribution
Michael Seavey
Chapter 12 Design Patterns and Reusability
Clemente Izurieta
Chapter 13 Test‑Driven Development
Madhusudan Srinivasan and Upulee Kanewala
PART 3 System Analysis
Chapter 14 Reliability
Christian K. Hansen
Chapter 15 Availability
Christian K. Hansen
Chapter 16 Maintainability
David R. Carey
Chapter 17 Performance Evaluation
Byeong Kil Lee
Chapter 18 Optimizing Complex Systems Operation
William Ross
PART 4 System Testing
Chapter 19 Types of Testing
Michael Seavey
Chapter 20 Software Test
Upulee Kanewala
Chapter 21 Error Handling
Stephyn G. W. Butcher
Chapter 22 Automated Test System Design
David R. Carey
Chapter 23 Interoperability and Design/Test Standards
Michael Seavey
PART 5 System Health
Chapter 24 Uncertainty and Uncertainty Propagation
Alessandro Ferrero
Chapter 25 Fault Detection, Localization, and Isolation
Jason Rupe
Chapter 26 Risk and Risk Analysis
Robert Taylor
Chapter 27 Risk‑Based Prognostics and Health Management
John W. Sheppard
Chapter 28 Structural Health Monitoring
Jamie Blanche, Ranjeetkumar Gupta, Daniel Mitchell, Sam Harper, and David Flynn
PART 6 System Security
Chapter 29 Risk Management Framework
Derek Reimanis
Chapter 30 Information Assurance, Vulnerability Analysis, and Remediation
William R. Simpson
Chapter 31 Cryptographic Systems
Keith M. Martin
Chapter 32 Software Security
John Marchesini and Sean Smith
PART 7 System Usage
Chapter 33 Human System Interaction – Interface Design
Laura Stanley and Vishnunarayan Girishan Prabhu
Chapter 34 Human and Privacy Rights
Razieh Nokhbeh Zaeem and K. Suzanne Barber
Chapter 35 Humanitarian Well‑Being
Kristen Intemann
Chapter 36 The Social Impacts of Complex Systems
Kristen Intemann
Biography
Anthony P. Ambler is a fellow of the IEEE, elected ‘For contributions to economics of testing complex digital devices and systems’. His research interests are in test economics, system test, and diagnosis. He received his B.Sc., M.Sc., and Ph.D. from the University of Manchester Institute of Science and Technology. He was appointed to a chair in Test Technology at Brunel University (UK) and then moved to the USA. He became chairman of Electrical & Computer Engineering at the University of Texas at Austin, then dean of Engineering & Computing at the University of South Carolina, and recently as dean of Technology at the University of Houston. In addition to his research work, he created the MS degree program in Engineering Management at UT Austin. He has acted as chair of the Organizing Committee of the European Design and Test Conference, general chair and program chair of IEEE International Test Conference and of IEEE International Conference on Computer Design. He has created a number of Workshops including on Test Economics, System Test and Diagnosis, and Production Test Automation.
John W. Sheppard is a Norm Asbjornson College of Engineering Distinguished Professor in the Gianforte School of Computing at Montana State University. His research interests include fault diagnosis/prognosis of complex systems, model‑based and Bayesian reasoning, explainable and ethical artificial intelligence, and distributed population‑based algorithms. He is a fellow of the IEEE, elected 'For contributions to system‑level diagnosis and prognosis'. He received his BS in computer science from Southern Methodist University and his MS and PhD in computer science from Johns Hopkins University. Before entering academia full‑time, he was a member of the industry for 20 years where his prior position was as a research fellow at ARINC Incorporated. He has been a long‑time leader in the IEEE Standards Association, chairing several working groups focused on publishing standards related to complex system test and diagnosis. Previously, he also served as the designated representative from the IEEE Computer Society to the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
