1st Edition

Scanning Transmission Electron Microscopy Advanced Characterization Methods for Materials Science Applications

Edited By Alina Bruma Copyright 2021
164 Pages 25 Color & 81 B/W Illustrations
by CRC Press

164 Pages 25 Color & 81 B/W Illustrations
by CRC Press

164 Pages 25 Color & 81 B/W Illustrations
by CRC Press

Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron... Read more

Chapter 1 Practical Aspects of Quantitative and High-Fidelity

STEM Data Recording

[Lewys Jones]

Chapter 2 Machine Learning for Electron Microscopy

[Alex Belianinov]

Chapter 3 Application of Advanced Aberration-Corrected Transmission

Electron Microscopy to Material Science: Methods to Predict

New Structures and Their Properties

[O. I. Lebedev]

Chapter 4 Large Dataset Electron Diffraction Patterns for the

Structural Analysis of Metallic Nanostructures

[Arturo Ponce, José Luis Reyes-Rodríguez, Eduardo Ortega,

Prakash Parajuli, M. Mozammel Hoque, Azdiar A. Gazder]

Biography

Dr. Alina Bruma received her PhD degree in Nanoscale Physics from The University of Birmingham, UK in 2013. Dr. Bruma completed several postdoctoral stages at the Laboratory of Crystallography and Materials Science (CRISMAT-CNRS) France, University of Texas at San Antonio, USA and The National Institute of Standards and Technology, USA before moving to the American Institute of Physics Publishing in 2019. Her research has been focused on the study of crystalline structure of materials and the determination of their structure-property relationship using transmission electron microscopy and electron diffraction. Dr Bruma is also the Chairman of The Electron Diffraction sub-committee at the International Center for Diffraction Data (ICDD).