Spectral, Photon Counting Computed Tomography: Technology and Applications, 1st Edition (Hardback) book cover

Spectral, Photon Counting Computed Tomography

Technology and Applications, 1st Edition

Edited by Katsuyuki Taguchi, Ira Blevis, Krzysztof Iniewski

CRC Press

424 pages | 10 Color Illus. | 238 B/W Illus.

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Hardback: 9781138598126
pub: 2020-07-16
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Description

The book is a comprehensive cover of the latest developments in the most prevalent imaging modality (X-ray Computed Tomography (CT)) in its latest incarnation: Spectral, Dual-Energy and Photon Counting CT. Disadvantages of the conventional single-energy technique used by CT technology are that different materials cannot be distinguished and that the noise is larger. To address these problems, a novel spectral CT concept has been proposed. Spectral dual-energy CT (DE-CT) acquires two sets of spectral data and spectral Photon Counting CT (PC-CT) detects energy of x-ray photons to reveal additional material information of objects by using novel energy-sensitive, photon-counting detectors. The K-edge imaging may be a gateway for functional or molecular CT. The book covers detectors and electronics, image reconstruction methods, image quality assessments, a simulation tool, nanoparticle contrast agents, and clinical applications for spectral CT.

Table of Contents

PART I - Spectral, Dual-Energy CT: Clinical Perspective and Applications

Chapter 1 -Spectral Imaging Technologies and Apps and Dual Layer Detector Solution

Chapter 2 - Clinical Applications of Dual Energy CT in Neuroradiology

Chapter 3 - Dual Energy CT – Clinical

Chapter 4 - Imaging of the Breast with Photon Counting Detectors

PART II - Spectral, Photon-Counting CT: Clinical Perspective and Applications

Chapter 5 - Clinical Applications of photon-counting detector computed tomography, Part 1

Chapter 6 - Clinical Applications of photon-counting detector computed tomography, Part 2

Chapter 7 - Spectral CT imaging using MARS scanners

Chapter 8 - Advances in and uses of contrast agents for spectral photon counting computed tomography

Chapter 9 - Targeting Contrast Media for Spectral CT

PART III - Photon-Counting Detectors for Spectral CT

Chapter 10 - X-ray Detectors for Spectral Photon Counting CT

Chapter 11 - Spectral Performance of Photon-Counting Detectors: How well can we catch the rainbow?

Chapter 12 - Photon Counting Detectors Viewed as Non-Linear, Shift-Variant Systems

Chapter 13 - Signal Generation in Semiconductor Detectors for Photon Counting CT,

Chapter 14 - ASIC Electronics for Spectral CT

Chapter 15 - ChromAIX: Energy-Resolving Photon Counting Electronics for High-Flux Spectral CT

Chapter 16 - Modelling the Performance of Photon-counting X-ray Imaging Detectors

Chapter 17 - Design considerations for photon counting detectors: connecting detector characteristics to system performance

Chapter 18 - Photon counting detector simulator: Photon counting toolkit (PcTK)

PART IV - Image Reconstruction for Spectral CT

Chapter 19 - Image Formation in Spectral Computed Tomography

Chapter 20 - Spectral Distortion Compensation for Spectral

Chapter 21 - Novel regularization method with knowledge of region types and boundaries

About the Editors

Katsuyuki “Ken” Taguchi, Ph.D. is Professor in The Russell H. Morgan Department of Radiology and Radiological Science, The Johns Hopkins University School of Medicine. He has pioneered and implemented algorithms for prototypes and commercial scanners such as multi-slice CT in 1998, cardiac CT in 2000, and 256-slice CT in 2002. Due to those seminal works and his significant contribution, Dr. Taguchi has received IEEE Nuclear and Plasma Sciences Society 2008 Young Investigator Medical Imaging Science Award.

Ira Blevis is Principal Scientist in Philips Healthcare developing semiconductor radiation detectors and Photon Counting CT based on them. Recent progress with the detectors led to a prototype PC scanner based on CZT which served as a basis for an EU H2020 grant awarded to develop a full size prototype for clinical use; Ira served a term as Director of the Philips Project and serves as Philips PI on the Grant.

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a compound semiconductor detector company based in British Columbia, Canada. During his 12 years at Redlen he managed development of highly integrated CZT detector products in medical imaging and security applications.

About the Series

Devices, Circuits, and Systems

Learn more…

Subject Categories

BISAC Subject Codes/Headings:
TEC007000
TECHNOLOGY & ENGINEERING / Electrical
TEC008010
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General
TEC019000
TECHNOLOGY & ENGINEERING / Lasers & Photonics
TEC059000
TECHNOLOGY & ENGINEERING / Biomedical