This book addresses the problem of treating interior responses of complex electronic enclosures or systems, and presents a probabilistic approach. Relationships for determining the statistics of the driving fields to apply to a circuit analysis code representing part of an enclosed system's writing are worked out. Also addressed are limited spatial and frequency coherence essential to a statistically based field drive model. This text gives examples, different modeling, and describes how to make, interchange, and optimize models.
Table of Contents
Part I: The Development and Use of Statistical Electromagnetics (STEM) 1.Introduction 2.Concepts of Probability 3.Distribution and Autocorrelation of Internal Fields; The Chi Square Distribution 4.Field Distribution and Cable Response 5.The Log Normal Distribution 6. Chi Square Variants: The Lehman Distribution 7.Field-Test Checkout of Stem-Based Cable Current Models:Summary and Evaluation of Stem's Cutting Edge Part II: Information Presented to Assist the User of Statistical Electromagnetics(STEM) 8.Cavity Eigenmodes:Their Evaluation, Properties, and Perturbation by Dissipation and by Apertures 9.Characterization of Apertures 10.EM Pickup and Scattering by a Wire 11.Statistical Distribution of Fields in Complex Cavities 12.Summary of Cable-Current Prediction Methodology