Systems Engineering: Reliability Analysis using k-out-of-n Structures, 1st Edition (Hardback) book cover

Systems Engineering

Reliability Analysis using k-out-of-n Structures, 1st Edition

Edited by Mangey Ram, Tadashi Dohi

CRC Press

220 pages | 8 Color Illus. | 184 B/W Illus.

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Hardback: 9781138482920
pub: 2019-07-15
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Substantial amount of research has been conducted on consecutive k-out-of-n and related reliability systems over the past four decades. These systems have been used to model various engineering systems such as the microwave stations of telecoms network, oil pipeline systems, and vacuum systems in an electron accelerator. As such, studies of reliability properties of consecutive k-out-of-n structures have attracted significant attention from both theoretical and practical approaches. In the modern era of technology, the redundancies are employed in the various industrial systems to prevent them from failure/sudden failure or to recover from failures. This book is meant to provide knowledge and help engineers and academicians in understanding reliability engineering by using k-out-of-n structures. The material is also targeted at postgraduate or senior undergraduate students pursuing reliability engineering.

Table of Contents


Table of Contents

Evaluation Methods for Reliability of Consecutive-K Systems

Tomoaki Akiba, Taishin Naakamura, Xiao Xiao, and Hisashi Yamamoto

Reliability Properties of K-out-of-N: G Systems

Kodo Ito, and Toshio Nakagawa

A Summary of Maintenance Policies for K-out-of-N Models and Their Applications to Consecutive Systems

Lei Zhou, Taishin Naakamura, Toshio Nakagawa, Xiao Xiao, and Hisashi Yamamoto

Reliability Modeling and Estimation of pairs: G Balanced Systems

E. A. Elsayed, and Jingbo Guo

Sequencing Optimization for k-out-of-n: G Cold-Standby Systems Considering Reliability and Energy Consumption

Prashanthi Boddu, Liudong Xing, and Gregory Levitin

Impact of Correlated Failure on the Maintenance of Multi-state Consecutive 2-out-of-: Failed Systems

Bentolhoda Jafary, and Laance Fiondella

Structural and Probabilistic Examinations of -out-of-: G System and Their Application to an Optimal Construction of a Safety Monitoring System

Fumio Ohi

An analysis of (k+1)-out-of-n: F fault tolerant system with fixed warranty period

Nupur Goyal, and Mangey Ram

Reliability Analysis of Three-Stage Weighted 4-Out-of N: F System Subject to Possibility of Degradation After Repair with Inspection

Beena Nailwal, Bhagawati Prasad Joshi, and S. B. Singh

Signature of linear consecutive k-out-of-n system

Akshay Kumar, and Mangey Ram

About the Editors

Mangey Ram received the Ph.D. degree major in Mathematics and minor in Computer Science from G. B. Pant University of Agriculture and Technology, Pantnagar, India. He has been a Faculty Member for around ten years and has taught several core courses in pure and applied mathematics at undergraduate, postgraduate, and doctorate levels. He is currently a Professor at Graphic Era (Deemed to be University), Dehradun, India. Before joining the Graphic Era, he was a Deputy Manager (Probationary Officer) with Syndicate Bank for a short period. He is Editor-in-Chief of International Journal of Mathematical, Engineering and Management Sciences and the Guest Editor & Member of the editorial board of various journals. He is a regular Reviewer for international journals, including IEEE, Elsevier, Springer, Emerald, John Wiley, Taylor & Francis and many other publishers. He has published 130 research publications in IEEE, Taylor & Francis, Springer, Elsevier, Emerald, World Scientific and many other national and international journals of repute and also presented his works at national and international conferences. His fields of research are reliability theory and applied mathematics. Dr. Ram is a Senior Member of the IEEE, life member of Operational Research Society of India, Society for Reliability Engineering, Quality and Operations Management in India, Indian Society of Industrial and Applied Mathematics, member of International Association of Engineers in Hong Kong, and Emerald Literati Network in the U.K. He has been a member of the organizing committee of a number of international and national conferences, seminars, and workshops. He has been conferred with "Young Scientist Award" by the Uttarakhand State Council for Science and Technology, Dehradun, in 2009. He has been awarded the "Best Faculty Award" in 2011 and recently Research Excellence Award in 2015 for his significant contribution in academics and research at Graphic Era.

Tadashi Dohi received his Bachelor, Master and Doctor of Engineering degrees from Hiroshima University, Japan, in 1989, 1991 and 1995, respectively. In 1992 he joined as an Assistant Professor in the Department of Industrial and Systems Engineering, Hiroshima University. In 1992 and 2000, he was a Visiting Researcher in the Faculty of Commerce and Business Administration, University of British Columbia, Canada, and Hudson School of Engineering, Duke University, USA, respectively, on the leave absent from Hiroshima University. Since 2002, he has been working as a Full Professor in the Department of Information Engineering, Graduate School of Engineering, Hiroshima University. He is currently the Vice Dean of School of Informatics and Data Science, Hiroshima University. His research areas include Reliability Engineering, Software Reliability, Dependable Computing, Performance Evaluation, Computer Security and Operations Research. He is a Regular Member of ORSJ, IEICE, IPSJ, REAJ, IEEE Computer Society, and IEEE Reliability Society. He published over 500 peer-reviewed papers, 30 book chapters, and edited 20 books/proceedings in the above research area. Dr. Dohi served as the General Chair of several international conferences; AIWARM 2004-2012, WoSAR 2008, IEEE MENS 2010, IEEE ISSRE 2011, IEEE ATC 2012, Software 2013, QR2MSE 2014 and 2016, among others. He has worked as a Program Committee Member in many international premier conferences such as IFIP/IEEE DSN, IEEE ISSRE, IEEE COMPSAC, IEEE SRDS, IEEE QRS, IEEE EDCC, IEEE PRDC, IEEE HASE, ACM SAC, ACM ICPE. He is an Associate Editor/Editorial Board Member of a dozen of international journals including IEEE Transactions on Reliability. He is and the President of Reliability Engineering Association of Japan (REAJ).

Subject Categories

BISAC Subject Codes/Headings:
TECHNOLOGY & ENGINEERING / Engineering (General)
TECHNOLOGY & ENGINEERING / Operations Research