1st Edition

The Knowledge Management Yearbook 2000-2001

  • This format is currently out of stock.
ISBN 9780750672580
Published August 15, 2011 by Routledge
576 Pages

USD $220.00

Prices & shipping based on shipping country


Book Description

The Knowledge Management Yearbook is the most current and comprehensive resource available for knowledge management professionals; no other source of information so thoroughly surveys the state of the knowledge management discipline and industry and how they impact businesses and other organizations. Featuring both definitive articles and cutting-edge knowledge management techniques and research contributed by authorities, The Knowledge Management Yearbook covers the nature of knowledge and its management, knowledge-based strategies, knowledge management and organizational learning, and knowledge tools, techniques, and processes.

The reference section includes a set of up-to-date directories detailing on-line knowledge management resources, KM publications and organizations, and notable KM Quotes. The glossary of KM terms is increasingly perceived by the industry as a benchmark by which this evolving discipline is defined. The Knowledge Management Yearbook is an indispensable volume for any professional helping to shape his or her organization's knowledge strategy.

Table of Contents

Part One - The Nature of Knowledge and its Management; Part Two - Knowledge-Based Strategies; Part Three - Knowledge Management and Organization Learning; Part Four - Knowledge Tools, Techniques and Processes; Part Five - Knowledge Reference Materials.

View More


Some of my favourite articles on knowledge management are in the yearbook and i'm happy to have them all in one bound collection. I recommend the Yearbook as a useful addition to the library of knowledge management practitioners. You can dip into it to find a useful and thought-provoking article on virtually any aspect of knowledge management, as well as pointers to other valuable resources.
Charles P Seeley, Knowledge Management Review, Vol 4 iss 3 July/August 2001