Topics in Electron Diffraction and Microscopy of Materials: 1st Edition (Hardback) book cover

Topics in Electron Diffraction and Microscopy of Materials

1st Edition

Edited by Peter. B Hirsch

CRC Press

196 pages

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Hardback: 9780750305389
pub: 1999-01-01
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Description

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.

The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

Table of Contents

Introduction

P.B. Hirsch

Early days of diffraction contrast transmission electron microscopy

P.B. Hirsch

Applications of weak-beam technique of electron microscopy

D.J.H. Cockayne

2-beam and n-beam diffraction

A.F. Moodie

Pseudo aberration-free-focusing imaging method for atomic resolution electron microscopy of crystals

H. Hashimoto

Probing atomic bonding using fast electrons

C.J. Humphreys and G.A. Botton

Interpretation of spatially resolved valence loss spectra

A. Howie

Is molecular imaging possible?

J.C.H. Spence et al.

Diffraction imaging using backscattered electrons: fundamentals and applications

S.L. Dudarev

Development of dynamical theory of RHEED and applications to the in situ monitoring of MBE growth

L.-M. Peng

Index

About the Series

Series in Microscopy in Materials Science

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Subject Categories

BISAC Subject Codes/Headings:
SCI077000
SCIENCE / Solid State Physics
TEC021000
TECHNOLOGY & ENGINEERING / Material Science