1st Edition

Topics in Electron Diffraction and Microscopy of Materials

Edited By Peter. B Hirsch Copyright 1999
208 Pages
by CRC Press

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials,... Read more
Introduction
P.B. Hirsch

Early days of diffraction contrast transmission electron microscopy
P.B. Hirsch

Applications of weak-beam technique of electron microscopy
D.J.H. Cockayne

2-beam and n-beam diffraction
A.F. Moodie

Pseudo aberration-free-focusing imaging method for atomic resolution electron microscopy of crystals
H. Hashimoto

Probing atomic bonding using fast electrons
C.J. Humphreys and G.A. Botton

Interpretation of spatially resolved valence loss spectra
A. Howie

Is molecular imaging possible?
J.C.H. Spence et al.

Diffraction imaging using backscattered electrons: fundamentals and applications
S.L. Dudarev

Development of dynamical theory of RHEED and applications to the in situ monitoring of MBE growth
L.-M. Peng

Index

Biography

Peter. B Hirsch