1st Edition
X-Ray Diffraction Imaging Technology and Applications
1 Coded Aperture X-Ray Diffraction Tomography
Joel A. Greenberg
2 Semiconductor Sensors for XRD Imaging
Krzysztof Iniewski and Adam Grosser
3 Integrated Circuits for XRD Imaging
Krzysztof Iniewski
4 Applications of X-Ray Diffraction Imaging in Medicine
Manu N. Lakshmanan
5 Materials Science of X-Ray Diffraction
Scott D. Wolter
6 X-Ray Diffraction and Focal Construct Technology
Keith Rogers and Paul Evans
7 X-Ray Diffraction Tomography: Methods and Systems
Shuo Pang and Zheyuan Zhu
8 Energy-Resolving Detectors for XDi Airport Security Systems
Dirk Kosciesza
Biography
Joel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection.
