Electron Microscopy and Analysis, Third Edition

By Peter J. Goodhew, John Humphreys, Richard Beanland

© 2000 – CRC Press

264 pages | 147 Color Illus.

Purchasing Options:
Paperback: 9780748409686
pub: 2000-11-29
US Dollars$79.95
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About the Book

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Subject Categories

BISAC Subject Codes/Headings:
TEC015000
TECHNOLOGY & ENGINEERING / Imaging Systems
TEC019000
TECHNOLOGY & ENGINEERING / Lasers & Photonics
TEC021000
TECHNOLOGY & ENGINEERING / Material Science