1st Edition
Advanced Materials Characterization Basic Principles, Novel Applications, and Future Directions
144 Pages
57 B/W Illustrations
by
CRC Press
144 Pages
57 B/W Illustrations
by
CRC Press
144 Pages
57 B/W Illustrations
by
CRC Press
Also available as eBook on:
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include... Read more
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
Biography
Ch Sateesh Kumar
