1st Edition

Applied Measurement with jMetrik

By J. Patrick Meyer Copyright 2014
170 Pages 55 B/W Illustrations
by Routledge

170 Pages 55 B/W Illustrations
by Routledge

170 Pages 55 B/W Illustrations
by Routledge

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner . Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each... Read more
Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

Biography

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia