Design and Analysis of Accelerated Tests for Mission Critical Reliability: 1st Edition (Hardback) book cover

Design and Analysis of Accelerated Tests for Mission Critical Reliability

1st Edition

By Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan

Chapman and Hall/CRC

248 pages | 130 B/W Illus.

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pub: 2004-04-27
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Description

Early approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the accelerating stress. This corresponds to the simplest physical model of the kinetics governing the underlying degradation, but this simple model does not always hold. We need to understand what more complex physical models may look like.

Design & Analysis of Accelerated Tests for Mission Critical Reliability presents innovative theory and methods for recognizing and handling the more complicated, cases often encountered in practice. The theory integrates a physical understanding of underlying phenomena and the statistical modeling of observation "noise" to provide a single theoretical framework for accelerated testing. The treatment includes general approaches that can be used with various computational software packages and an explicit computing environment in S-PLUS. Source code written by the authors is included and available for download from http://www.crcpress.com/e_products/downloads.

For practitioners, this book provides immediately useable tools. For researchers, it presents intriguing open questions. And for the academic community, numerous worked examples, end-of-chapter exercises, and a format that relegates technical and theoretical details to chapter appendices make this an outstanding supplementary textbook for senior and graduate-level students.

Reviews

"I believe that this book could be a good specialized reference text … ."

- Technometrics, May 2005, Vol. 47, No. 2

"[I]t is a useful and welcome start in an important area. The inclusion of a software system that aids specification and visualization of kinetic models is also welcome. One hopes that this book will spur further research in this area."

-Short Book Reviews of the International Statistical Institute

"For practitioners, this book provides immediately useable tools. For researchers, it presents intriguing open questions. For the academic community, numerous worked examples, end-of-chapter exercises, and a format that relegates technical and theoretical details to chapter appendices make this an outstanding supplementary textbook for senior and graduate-level students."

-Zentralblatt MATH 1053

Table of Contents

BACKGROUND

Introduction

Other Approaches

The Foundation of our Approach

An Example

The Organization of this Book

Complement to Chapter 1: Background Kinetics and Statistics

DEMARCATION MAPPING: INITIAL DESIGN OF ACCELERATED TESTS

Analytical Theory of Thermal Demarcation Maps

Designing an Acceptance Test for a Purely Thermal Process

Simple Temperature Humidity Models

Designing an Acceptance Test for a Temperature Humidity Model

Mechanical Cycling Models

Acceptance Testing for Mechanical Cycling Induced by Thermal Cycling

Computational Demarcation Mapping

Beta Binomial Interpretation of 0 Failures

An Extrapolation Theorem

Summary

Complements to Chapter 2

INTERFACE FOR BUILDING KINETIC MODELS

Descriptions and Concepts Behind the Interface

Complement to Chapter 3, Our Interface in S-PLUS®, Kinetic Data Objects and the GUIs to Create Them

EVANESCENT PROCESS MAPPING

Building Blocks for the Theory

Identifying Neighborhoods of Models, Sampling, and "Chunking"

Example

Summary, Limitations of Accelerated Testing

Complement to Chapter 4: Using the Evanescent Process Mapping Interface to duplicate example 4.3

DATA ANALYSIS FOR FAILURE TIME DATA

A Simple Data Set

Adding Physical Sense to the Model

Analysis of a Real Data Set

Complement: Maximum Likelihood Analysis

Complement: Statistical Estimation of Kinetics from Failure Time Data

Complement: Pseudo Maximum Likelihood Estimation

Complement: The Kaplan Meier Estimate

Complement: Printed Wiring Board Data

Complement: Using the Interface

Complement: Exercises to Explore some Questions in Experiment Design

DATA ANALYSIS FOR DEGRADATION DATA

Motivation and Models

Background for the Example

Data Analysis for the Example

Complement: Background Statistical Theory

Complement: Using the Software to Analyse the Example Data

Complement: Exercises for Data Analysis and Experiment Design

Subject Categories

BISAC Subject Codes/Headings:
BUS053000
BUSINESS & ECONOMICS / Quality Control
TEC032000
TECHNOLOGY & ENGINEERING / Quality Control