Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000, 1st Edition (Hardback) book cover

Microbeam Analysis

Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000, 1st Edition

Edited by D Williams, R Shimizu

CRC Press

284 pages

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pub: 2000-01-01
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Description

Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

Table of Contents

Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.

About the Series

Institute of Physics Conference Series

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Subject Categories

BISAC Subject Codes/Headings:
SCI055000
SCIENCE / Physics
SCI077000
SCIENCE / Solid State Physics