High Performance Instrumentation and Automation: 1st Edition (Hardback) book cover

High Performance Instrumentation and Automation

1st Edition

By Patrick H. Garrett

CRC Press

240 pages | 165 B/W Illus.

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Hardback: 9780849337765
pub: 2005-05-26
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Description

Improvements in process control, such as defined-accuracy instrumentation structures and computationally intelligent process modeling, enable advanced capabilities such as molecular manufacturing. High Performance Instrumentation and Automation demonstrates how systematizing the design of instrumentation and automation leads to higher performance through more homogeneous systems, which are frequently assisted by rule-based, fuzzy logic, and neural network process descriptions.

Incorporate Advanced Performance Enhancements into Your Automation Enterprise

The book illustrates generic common core process-to-control concurrent engineering linkages applied to a variety of laboratory and industry automation systems. It outlines:

  • Product properties translated into realizable process variables
  • Axiomatic decoupling of subprocess variables for improved robustness
  • Production planner model-driven goal state execution
  • In situ sensor and control structures for attenuating process disorder
  • Apparatus tolerance design for minimizing process variabilities
  • Production planner remodeling based on product features measurement for quality advancement

Coverage also includes multisensor data fusion, high-performance computer I/O design guided by comprehensive error modeling, multiple sensor algorithmic error propagation, robotic axes volumetric accuracy, quantitative video digitization and reconstruction evaluation, and in situ process measurement methods.

High Performance Instrumentation and Automation reflects the experience of engineer and author Patrick Garrett, including his role as co-principal investigator for an Air Force intelligent manufacturing initiative.

You can download Analysis Suite.xls,, computer-aided design instrumentation software, available in the book's description on the CRC Press website.

Table of Contents

THERMAL, MECHANICAL, QUANTUM, AND ANALYTICAL SENSORS

Introduction

Instrumentation Error Interpretation

Temperature Sensors

Mechanical Sensors

Quantum Sensors

Analytical Sensors

Bibliography

INSTRUMENTATION AMPLIFIERS AND PARAMETER ERRORS

Introduction

Device Temperature Characteristics

Differential Amplifiers

Operational Amplifiers

Instrumentation Amplifiers

Amplifier Parameter Error Evaluation

Bibliography

INSTRUMENTATION FILTERS WITH NOMINAL ERROR

Introduction

Bandlimiting Instrumentation Filters

Active Filter Networks

Filter Error Analysis

Bibliography

SIGNAL ACQUISITION, CONDITIONING, AND PROCESSING

Introduction

Low-Level Signal Acquisition

Signal Quality in Random and Coherent Interference

DC, Sinusoidal, and Harmonic Signal Conditioning

Analog Signal Processing

Bibliography

DATA CONVERSION DEVICES AND ERRORS

Introduction

Analog Multiplexers

Sample-Holds

Digital-to-Analog Converters

Analog-to-Digital Converters

Bibliography

SAMPLED DATA AND RECOVERY WITH INTERSAMPLE ERROR

Introduction

Sampled Data Theory

Aliasing of Signal and Noise

Sampled Data Intersample and Aperture Error

Output Signal Interpolation Functions

Video Sampling and Reconstruction

Bibliography

ADVANCED INSTRUMENTATION SYSTEMS AND ERROR ANALYSIS

Introduction

Integrated Instrumentation Design

Multisensor Error Propagation

Robotic Axes Volumetric Error

Bibliography

Appendix A

AUTOMATION SYSTEMS CONCURRENT ENGINEERING

Introduction

Concurrent Engineering Common Core

Product Property Apparatus Variables

Robust Process Axiomatic Design

Automated Production Ex Situ Planner

Molecular In Situ Subprocess Control

System Variability Tolerance Analysis

Product Features Remodeling for Quality Maturity

Bibliography

MOLECULAR BEAM EPITAXY SEMICONDUCTOR PROCESSING

Introduction

Molecular Beam Epitaxy Concurrent Engineering

MBE Material Property Modeling

Robust Process Design and PID Tuning

MBE In Situ Ellipsometry

Instrumentation and Control Tolerance Analysis

Bibliography

AEROSPACE COMPOSITES RULE-BASED MANUFACTURING

Introduction

Composite Manufacturing Concurrent Engineering

Composite Cure Properties and Apparatus

Computational Qualitative Reasoning

Rule-Based Ex Situ Planner

In Situ Sensor Fusion Cure Control

Temperature Control Tolerance Analysis

Bibliography

FUZZY LOGIC LASER DEPOSITION SUPERCONDUCTOR PRODUCTION

Introduction

Superconductor Processing Concurrent Engineering

Material Property Modeling

Robust Axiomatic Process Decoupling

Observer Remodeled Ex Situ Planner

Spectrometer In Situ Fuzzy Control

Process Data Tolerance Evaluation

Superconductor Raman Quality Analysis

Bibliography

NEURAL NETWORK DIRECTED STEEL ANNEALING

Introduction

Steel Annealing Concurrent Engineering

Recrystallization Annealing Physical Properties

ANNEAL NET Ex Situ Planner

Steel Annealing In Situ Control

Bibliography

X-RAY CONTROLLED VAPOR INFILTRATION CERAMIC DENSIFICATION

Introduction

Ceramic Matrix Composite Concurrent Engineering

Combustor Product Property Modeling

Microwave Densification Ex Situ Planner

X-Ray and Infrared In Situ Control

Bibliography

INDEX

Subject Categories

BISAC Subject Codes/Headings:
TEC064000
TECHNOLOGY & ENGINEERING / Sensors